The advent of 5G, accompanied by technologies like silicon photonics and other integrated optics, has triggered the rapid transformation of the testing requirements for passive optical components. There are new things to consider now with the appearance of WDM channels spaced closer together, optical filters with sharper spectrums or high-port-count optical components. Let’s take a look how to address these parametric testing challenges.
Electronically controlled. Center wavelength and bandwidth can both be set precisely and independently. Covers all key wavelengths from 1260 nm to 1650 nm and bandwidths from 32 pm (4 GHz) to 5 nm.
With the XTM-50 both center wavelength and bandwidth can be independently adjusted. It is manually controlled and versions are available covering all the key telecom wavelengths from 1260 nm to1650 nm and bandwidths from 32 pm (4 GHz) to 5 nm.
Most advanced and cost-effective solution for R&D and Manufacturing environments. Offers a signal to source spontaneous emission ratio higher than 90 dB.
Compact tester for fast and accurate characterization of passive optical components
Unrivaled passive optical component testing platform for WDM components and photonic integrated circuits
Fastest diffraction-grating-based instrument operating from 1250 to 1700 nm. Provides fast, accurate, high dynamic range scan. Unique touch-sensitive display with multitouch gesture control.