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CD-4000 Clock Data Recovery - Optical and electrical CDR for 28 GBd/56 GBd

Efficient CDR solution for the production line.

Key features

Supports NRZ and PAM4 signals
Supports singlemode and multimode
Integrated O/E with optical splitter
Ultra-low random jitter
Auto-locking

Description

The purpose of designing various protocols is to transfer a set of information (data) from one place to another. Serial data communication is then used to transmit the data at a high speed. At the receiver end, the transmitted data must be retrieved without losing its integrity with the accompanied timing information. This process is called clock and data recovery (CDR).

The CD-4000 enables an optimized synchronization between the BA-4000 Bit Analyzer and the EA-4000 sampling oscilloscope.

The CD-4000 Clock Recovery—along with the EA-4000 Eye Analyzer, the BA-4000 Bit Analyzer and the MA-4000 Module Analyzer—is part of EXFO’s unique solution for transceiver validation from end to end.

Resources

All resources
Blog
How to address challenges in the end-to-end qualification of pluggable transceivers? - English (January 17, 2021)
Webinar
End-to-end testing for 800G optical communication networks - English (May 16, 2023)
Webinar
400G and beyond: End-to-end qualification in transceiver manufacturing - English (May 16, 2023)
Webinar
Still bogged down by issues when rolling out next-gen high speeds from R&D to manufacturing? - English (May 16, 2023)
Application notes
Unveiling the secrets of 200G/400G optical transceivers - English (March 20, 2020)
Reference guides
Notice Important Information CD-4000 - English (United States) (November 23, 2022)
Reference guides
Notice Important Information CD-4000 - Français (Canada) (November 23, 2022)
Flyers and pamphlets
Leading-edge transmission testing up to 800G - English (United States) (October 26, 2021)
Flyers and pamphlets
Leading-edge transmission testing up to 800G - 中文(中国) (October 26, 2021)
Flyers and pamphlets
Leading-edge transmission testing up to 800G - 日本語 (日本) (October 26, 2021)
Application notes
Testing next-gen PIC-based transceivers - English (July 07, 2021)
Spec sheet
CD-4000 Clock Data Recovery - English (June 17, 2022)
Spec sheet
CD-4000 Clock Data Recovery - Français (June 17, 2022)
Spec sheet
CD-4000 Clock Data Recovery - 中文 (June 17, 2022)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - English (United States) (June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 中文(中国) (June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 日本語 (日本) (June 20, 2023)

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