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EA-4000 - Optical and electrical sampling oscilloscope

The fastest sampling scope in the industry supporting 28G NRZ signals.

Key Features

Ultra-fast optical and electrical sampling scope 1M sample/sec measure 1000 waveforms in 2 seconds (2000 sample/waveform)
Optical receiver supporting single mode and multimode
25G EA-4000 model supporting 10G – 28G
10G EA-4000 for PON applications supporting 1G – 10G 
Built-in switch models to support Combo PON (CPON) application
Target at mass production line

Specifications

Technical specifications
Product type Benchtop
Spec sheet

Key features

Ultra-fast 1M samples/s, measures 1000 waveforms in 2 seconds (2000 samples/waveform)
Optical receiver support singlemode and multimode
Repeatable measurements and comparable to Tier-1 scope
Supports PRBS31 pattern lock (optional)
Built-in low jitter mode (optional)

Applications

Production testing of transceivers: evaluation and validation
Sensitivity testing of optical receivers
TP1-a stress calibration

Description

The EA-4000 Eye Analyzer is the industry’s fastest optical and electrical sampling oscilloscope. It is ideal for eye diagram analysis when characterizing transmitters and receivers on the production floor. The EA-4000 supports singlemode and multimode fibers and has been designed with an ultra-low jitter mode for outstanding performance in manufacturing.

Extended capabilities are available with either single or dual ports for electrical and optical characterization of NRZ-based components.

The EA-4000 has three models that cover different applications:

EA-4000 three models table

Low rates such as 1.25G, 2.5G and 10G are also supported. For more details, please refer to the specification sheet.

The EA-4000 Eye Analyzer—along with the BA-4000 Bit Analyzer, the MA-4000 Module Analyzer and the CD-4000 Clock Recovery—is part of EXFO’s unique solution for transceiver validation from end to end.

Resources

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Blog
How to address challenges in the end-to-end qualification of pluggable transceivers? - English (January 17, 2021)
Webinar
Still bogged down by issues when rolling out next-gen high speeds from R&D to manufacturing? - English (May 16, 2023)
Application notes
Unveiling the secrets of 200G/400G optical transceivers - English (March 20, 2020)
Flyers and pamphlets
Leading-edge transmission testing up to 800G - English (October 26, 2021)
Flyers and pamphlets
Leading-edge transmission testing up to 800G - 中文 (October 26, 2021)
Flyers and pamphlets
Leading-edge transmission testing up to 800G - 日本語 (October 26, 2021)
Application notes
Testing next-gen PIC-based transceivers - English (July 07, 2021)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - English (June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 中文 (June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 日本語 (June 20, 2023)
Flyers and pamphlets
EA-4000 sampling scope - English (April 21, 2022)
Flyers and pamphlets
PIC-Optical integrated circuits test solution - 日本語 (October 26, 2021)
Reference guides
Notice Important Information EA-4000 - English (November 23, 2022)
Reference guides
Notice Important Information EA-4000 - Français (November 23, 2022)
User manual
EA-4000 SCPI - English (December 22, 2021)

Support