OPAL-MD - Multi-die automated test station

Accurate, automated, fast testing of photonic integrated circuits (PIC) with traceable results.

Key Features

Multi-die PIC characterization in one single execution
Flexible design with reconfigurable probes
Single software suite for preparation, execution and analysis of PIC test data
Operates with EXFO optical component tester and other test equipment
Ultra-precise optical heads – ideal for surface and edge-coupling
Precise DC and RF probing positioners

Asistencia