Optical and electrical sampling oscilloscope

The fastest sampling scope in the industry. A powerful solution for the 5G production line.

Características principales

Ultra-fast 1M samples/s, measures 1000 waveforms in 2 seconds (2000 samples/waveform)
Optical receiver support singlemode and multimode
Repeatable measurements and comparable to Tier-1 scope
Supports PRBS31 pattern lock (optional)
Built-in low jitter mode (optional)

Aplicaciones

Production testing of transceivers: evaluation and validation
Sensitivity testing of optical receivers
TP1-a stress calibration

Description

The EA-4000 Eye Analyzer is the industry’s fastest optical and electrical sampling oscilloscope. It is ideal for eye diagram analysis when characterizing transmitters and receivers on the production floor. The EA-4000 supports singlemode and multimode fibers and has been designed with an ultra-low jitter mode for outstanding performance in manufacturing.

Extended capabilities are available with either single or dual ports for electrical and optical characterization of NRZ-based components.

The EA-4000 has three models that cover different applications:

EA-4000 three models table

Low rates such as 1.25G, 2.5G and 10G are also supported. For more details, please refer to the specification sheet.

The EA-4000 Eye Analyzer—along with the BA-4000 Bit Analyzer, the MA-4000 Module Analyzer and the CD-4000 Clock Recovery—is part of EXFO’s unique solution for transceiver validation from end to end.

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Blog
How to address challenges in the end-to-end qualification of pluggable transceivers? - Español (enero 17, 2021)
Seminarios web
Still bogged down by issues when rolling out next-gen high speeds from R&D to manufacturing? - Español (mayo 16, 2023)
Notas de aplicación
Unveiling the secrets of 200G/400G optical transceivers - English (marzo 20, 2020)
Manual del usuario
EA-4000 Eye Analyzer - English (noviembre 01, 2021)
Hoja de especificaciones
EA-4000 Eye Analyzer - English (mayo 17, 2022)
Hoja de especificaciones
EA-4000 Eye Analyzer - 中文 (mayo 17, 2022)
Volantes y panfletos
Leading-edge transmission testing up to 800G - English (octubre 26, 2021)
Volantes y panfletos
Leading-edge transmission testing up to 800G - 中文 (octubre 26, 2021)
Volantes y panfletos
Leading-edge transmission testing up to 800G - 日本語 (octubre 26, 2021)
Notas de aplicación
Testing next-gen PIC-based transceivers - English (julio 07, 2021)
Volantes y panfletos
Testing photonics and optical components for manufacturing, design and research challenges - English (junio 20, 2023)
Volantes y panfletos
Testing photonics and optical components for manufacturing, design and research challenges - 中文 (junio 20, 2023)
Volantes y panfletos
Testing photonics and optical components for manufacturing, design and research challenges - 日本語 (junio 20, 2023)
Volantes y panfletos
EA-4000 sampling scope - English (abril 21, 2022)
Volantes y panfletos
PIC-Optical integrated circuits test solution - 日本語 (octubre 26, 2021)

Asistencia