Recursos
Todos los recursos
Guía de referencia
CT440/CTP10 - English
(diciembre 01, 2022)
Blog
Mastering the Mueller method with swept IL-PDL measurements - Español
(mayo 12, 2021)
Folletos y catálogos
Passive component characterization - English
(diciembre 23, 2024)
Folletos y catálogos
Passive component characterization - 中文
(diciembre 23, 2024)
Notas de aplicación
Assessing passive components using a CT440 or an OSA20 - English
(mayo 08, 2018)
Notas de aplicación
CT440 line detection feature for accurate wavelength measurement - English
(julio 27, 2018)
Notas de aplicación
Swept IL measurement: Key notions and future-proof solutions - English
(abril 23, 2019)
Posters de referencia
Testing photonic integrated circuits and passive components - English
(diciembre 17, 2024)
Posters de referencia
Testing photonic integrated circuits and passive components - 中文
(diciembre 17, 2024)
Informe técnico
117 - Optical component testing in a rapidly evolving 5G world - English
(mayo 15, 2019)
Folletos y catálogos
Optical testing solutions for manufacturing and R&D - English
(diciembre 23, 2024)
Volantes y panfletos
Testing photonics and optical components for manufacturing, design and research challenges - English
(junio 20, 2023)
Volantes y panfletos
Testing photonics and optical components for manufacturing, design and research challenges - 中文
(junio 20, 2023)
Volantes y panfletos
Testing photonics and optical components for manufacturing, design and research challenges - 日本語
(junio 20, 2023)