CTP10 - 无源光器件测试平台

性能强大的无源光器件测试平台,适用于测试WDM器件和光子集成电路

Key Features

使用扫频技术进行光损耗(IL、PDL和RL)与光电流测量  
业内率先支持全波段PDL测量,覆盖从1260 nm到1620 nm的波长 
集高动态范围、高精准度、亚皮米级分辨率和高测试速度于一身 
成的解决方案,配备GUI,并内置分析功能  
采用可扩展的架构,适用于研发和制造环境 
两种工作模式:使用专用模块进行的光学触发/使用日志记录功能进行的电气触发 

Applications

亚皮米级分辨率的集成光子器件光谱鉴定
制造和研发环境中的多输出无源光器件测试
WSS和ROADM校准与测试
薄膜滤波器(TFF)鉴定
瞬态现象日志记录功能
使用来自可调谐激光器的电气触发器进行光谱鉴定

Specifications

Technical specifications
Product type Platform
规格书

Full Description

The CTP10 is a modular passive optical component testing platform that combines speed, accuracy and flexibility. It offers reliable high-quality insertion loss (IL), return loss (RL) or polarization-dependent loss (PDL) measurement regardless of wavelength range or spectral characteristics of the device under test. It operates together with EXFO’s series of swept tunable lasers to perform these measurements within seconds and can be configured to acquire photocurrent measurements directly from external photodiodes.

Thanks to its modular configuration, it is the ideal instrument to characterize large port count components used in WDM networks and photonic integrated circuits (PIC).



Next-gen platform and modules

Thanks to its innovative approach, the CTP10 also greatly reduces setup time and simplifies spectral characterization by taking care of many complex operations. Indeed, tunable laser sweep, data collection and processing for IL, RL or PDL, trace display and analysis are all performed from a single instrument.

The CTP10 platform is compatible with a selection of key modules for spectral characterization (IL PDL & IL PDL OPM2 modules or IL RL OPM2), wavelength control (SCAN SYNC and FBC modules), optical detection (OPMx module) and photocurrent meters (PCMx module). These fully integrated modules are hot-swappable and quickly reconfigurable to greatly reduce setup time and provide a flexible and evolutive test solution.

The CTP10 can also be set up to receive external triggers coming from a tunable laser and record optical power or photocurrent as​ a function of wavelength. In this configuration, the CTP10 only requires OPMLite or PCM modules. The resolution, accuracy and repeatability of the measurement lies with the laser, but the setup benefits from the detectors single gain range and fast averaging time. Additional capabilities include optical power time-logging suited for capturing optical transient phenomenon and analog signal output suited for automated optical alignment processes.

The CTP10 has an embedded operating system for handling and processing large amounts of data. It also offers a scalable architecture by sharing one or several tunable lasers among up to 8 test stations and by adding a secondary mainframe for 100+ ports testing.

Unparalleled performance

The CTP10 offers uncompromising performance and maintains best-in-class specifications at full speed over the full wavelength range of operation with an integrated setup. This combination of speed, accuracy, integration and spectral coverage is unprecedented on the market and ideal as a future-proof testing solution on next generation components such as wavelength selective switches (WSS) or ring-resonators.

The SCAN SYNC module provides a dynamic wavelength measurement with a sampling resolution down to 20 fm and excellent repeatability.

The range-free series of OPMx optical detectors can measure a dynamic range of >70 dB in a single sweep at 100 nm/s with 1 pm resolution. This ability substantially increases manufacturing and R&D throughput. OPMx detectors can also accurately measure extremely sharp spectral features of up to 10 dB/pm (10,000 dB/nm). PCMx photocurrent meters perform equally well when performing tasks such as measuring large current fluctuations coming from PIC-embedded photodiodes. The OPMLite are also particularly suited for detection scheme where tunable laser is connected directly to the power meter for spectral characterization.

Powerful intuitive GUI

The CTP10 has been developed around three key principles: integration, performance and automation. Its embedded software offers a powerful and intuitive GUI that seamlessly controls the measurement process to let you focus on what really matters: measurement data and analysis. Additionally, the CTP10 offers full remote control via SCPI‑compatible commands.

主要功能和优点

使用扫频技术进行光损耗(IL、PDL和RL光电流测量 

业内率先支持全波段PDL测量,覆盖从1260 nm1620 nm的波长 

高动态范围、高精准度、亚皮米级分辨率和高测试速度于一身 

集成的解决方案,配备GUI,并内置分析功能  

采用可扩展的架构,适用于研发和制造环境 

两种工作模式使用专用模块进行光学触发/使用日志记录功能进行电气触发 

应用

亚皮米级分辨率的集成光子器件光谱鉴定 

制造和研发环境多输出无源光器件测试 

WSS和ROADM校准与测试 

薄膜滤波器(TFF)鉴定 

瞬态现象日志记录功能 

使用来自可调谐激光器的电触发进行光谱鉴定 

描述 

CTP10是一个模块化无源光器件测试平台,集高速度、高精准度和高灵活性等优点于一身。无论被测器件的波长范围或光谱特性如何,它都能提供可靠的高质量插损(IL)、回损(RL)或偏振相关损耗(PDL)测量。它可以与EXFO的一系列扫频可调谐激光器配合使用,在几秒钟内进行这些测量,并可配置成直接从外部光电二极管获取光电流测量值。 

得益于模块化配置,它是鉴定WDM网络和光子集成电路(PIC)中所用的大端口数器件的理想仪表。

ctp10-figure

下一代平台与模块 

由于采用了创新的方法,CTP10还可以通过处理许多复杂的操作,大大缩短了设置时间并简化了光谱鉴定流程。事实上,可调谐激光器扫频、IL、RL或PDL的数据收集和处理、曲线显示和分析都可以在同一台仪表上完成。 

CTP10平台兼容一系列的关键模块,进行光谱鉴定(IL PDL和IL PDL OPM2模块或IL RL OPM2)、波长控制(SCAN SYNC和FBC模块)、光学检测(OPMx模块)和光电流测量(PCMx模块)。这些完全集成的模块可以热插拔和迅速重新配置,从而大幅缩短设置时间,并提供一款灵活和不断发展的测试解决方案。 

还可以将CTP10设置成接收来自可调谐激光器的外部触发,并记录光功率或光电流随波长变化的情况。在该配置中,CTP10只需要OPMLite或PCM模块。测量的分辨率、精准度和可重复性取决于激光器,但该设置受益于检测器的单增益范围和快速平均时间。其它功能包括适用于捕获光学瞬态现象的光功率时间日志记录和适用于自动光学准直过程的模拟信号输出。 

无可比拟的性能 

CTP10具有无可比拟的性能,并通过集成设置在整个波长范围内全速运行时保持一流的规格。这种速度、精准度、集成度和光谱覆盖范围的结合在整个市场上前所未有,是测试下一代器件(如波长选择开关(WSS)或环形谐振腔)的理想解决方案。

SCAN SYNC模块提供动态波长测量功能,采样分辨率最低可达20 fm,且可重复性极佳。 

无范围(range-free)系列OPMx光检测器能够以100 nm/s的速度和1 pm的分辨率,在单次扫描中测量>70 dB的动态范围。这种功能大幅提高了制造和研发能力。OPMx检测器还可以精准测量极其尖锐的光谱特征——高达10 dB/pm(10000 dB/nm)。在执行测量来自PIC内嵌光电二极管的大范围电流波动等任务时,PCMx光电流表的表现同样出色。OPMLite还特别适用于将可调谐激光器直接连接到功率计进行光谱鉴定的检测方案。

GUI强大直观 

CTP10的开发围绕三个关键原则:集成、性能和自动化。其内置软件提供了一个强大而直观的GUI,可以无缝控制测量过程,让您专注于真正重要的事情:测量数据和分析。此外,还可以通过SCPI兼容命令完全远程控制CTP10。 

奖项和荣誉 

创新和领导力一直是EXFO关注的核心和首要问题。每年,我们都努力开发出可在更智能的现代网络中确保优异客户体验的解决方案。得到这样的认可始终是一项殊荣。了解公司所获奖项的详情: 

Judge

通过强大的数据处理功能,可对 1240 nm 至 1680 nm 波长范围内的插入损耗和 PDL 进行高精度自动测量,大大缩短了测试时间。

无源光器件测试平台内的先进模块

支持