Resources
All resources
Application notes
Testing next-gen PIC-based transceivers - English
(July 07, 2021)
Spec sheet
BA-4000 - RF cable and connectors - English (United States)
(July 02, 2021)
Spec sheet
BA-4000 - RF cable and connectors - 中文(中国)
(July 02, 2021)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - English (United States)
(June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 中文(中国)
(June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 日本語 (日本)
(June 20, 2023)
Flyers and pamphlets
BA-4000 now with 800G FEC Generator and Checker (FGC) - English (United States)
(October 26, 2021)
Flyers and pamphlets
BA-4000 now with 800G FEC Generator and Checker (FGC) - 中文(中国)
(October 26, 2021)
Flyers and pamphlets
BA-4000 now with 800G FEC Generator and Checker (FGC) - 日本語 (日本)
(October 26, 2021)
Flyers and pamphlets
EXFO demos - OIF interops - English (United States)
(March 18, 2022)
Flyers and pamphlets
PIC-Optical integrated circuits test solution - 日本語 (日本)
(October 26, 2021)
Declaration of conformity
BA-4000 | CE - English (United States)
(June 29, 2021)
Product demos
800G bit-error-rate testing enhanced with FEC capabilities - English
(May 18, 2023)
Product demos
Leading-edge BER testing up to 800G - English
(May 18, 2023)
Promotional videos
Overcoming E2E transceiver testing challenges with EXFO - English
(May 18, 2023)