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BA-4000 Bit Analyzer - Electrical 800G Bit Error Rate Tester

BER tester powered up with forward error correction (FEC) margin.

Key features

100G (4x28GBd), 400G (4x56GBd) & 800G (8x56GBd)
Supports NRZ and PAM4
Supports PRBS 7/9/11/13/15/23/31/13Q/31Q, SSPRQ
FEC capability: RS-FEC Scrambled Idle Pattern for testing 53 GBd host side interfaces
Channel simulator
Burst/random error injection
Supports linear/gray mapping
O-SMPM connection

Applications

Test and validation of transceivers
Test of subassemblies such as TOSA and ROSA
Test of FPGA, Module Compliance Board (MCB) and Host Compliance Board (HCB)

Description

Bit error rate (BER) is a key performance attribute for digital communications. The signal transmission quality of a network, subsystem or component, can be evaluated using a BER tester, which compares the data stream received to the transmitted sequence and computes the number of errors.

The BA-4000 Bit Analyzer is an electrical NRZ/PAM4 BER tester designed for the production floor. It comes in six models:

  • BA-4000-4-28-NRZ: 100G BERT including 4-channel NRZ 28 Gbit/s.
  • BA-4000-8-28-NRZ: 200G BERT including 8-channel NRZ 28 Gbit/s.
  • BA-4000-4-28-PAM: 100G/200G BERT enabling either 4-channel NRZ 28 Gbit/s or 4-channel PAM4 28 GBd.
  • BA-4000-4-56-PAM: 200G/400G BERT enabling either 4-channel NRZ 56 Gbit/s or 4-channel PAM4 56 GBd.
  • BA-4000-8-28-PAM: 200G/400G BERT suitable for either 8-channel NRZ 28 Gbit/s or 8-channel PAM4 28 GBd.
  • BA-4000-8-56-PAM: 400G/800G BERT suitable for either 8-channel NRZ 56 Gbit/s or 8-channel PAM4 56 GBd.

The BA-4000 Bit Analyzer leverages FEC simulation capabilities to provide powerful analysis for burst error. Some of the main FEC features are:

  • PRBS error check and correction
  • Pre-FEC and Post-FEC BER
  • KP4/KR4 and low latency FEC protocols
  • FEC Generator and Checker (FGC) to address RS-FEC Scrambled Idle Pattern
  • FEC symbol error distribution plot: codewords vs symbols errors
  • FEC margin auto-calculation

Resources

All resources
Application notes
Testing next-gen PIC-based transceivers - English (July 07, 2021)
Spec sheet
BA-4000 - RF cable and connectors - English (United States) (July 02, 2021)
Spec sheet
BA-4000 - RF cable and connectors - 中文(中国) (July 02, 2021)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - English (United States) (June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 中文(中国) (June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 日本語 (日本) (June 20, 2023)
Flyers and pamphlets
BA-4000 now with 800G FEC Generator and Checker (FGC) - English (United States) (October 26, 2021)
Flyers and pamphlets
BA-4000 now with 800G FEC Generator and Checker (FGC) - 中文(中国) (October 26, 2021)
Flyers and pamphlets
BA-4000 now with 800G FEC Generator and Checker (FGC) - 日本語 (日本) (October 26, 2021)
Flyers and pamphlets
EXFO demos - OIF interops - English (United States) (March 18, 2022)
Flyers and pamphlets
PIC-Optical integrated circuits test solution - 日本語 (日本) (October 26, 2021)
Declaration of conformity
BA-4000 | CE - English (United States) (June 29, 2021)
Product demos
800G bit-error-rate testing enhanced with FEC capabilities - English (May 18, 2023)
Product demos
Leading-edge BER testing up to 800G - English (May 18, 2023)
Promotional videos
Overcoming E2E transceiver testing challenges with EXFO - English (May 18, 2023)

Support