Resources
All resources
Blog
Mastering the Mueller method with swept IL-PDL measurements - English
(May 12, 2021)
Reference guides
CT440/CTP10 selection guide - English (United States)
(December 01, 2022)
Brochures and catalogs
Passive component characterization - English
(December 01, 2022)
Brochures and catalogs
Passive component characterization - 中文
(December 01, 2022)
Spec sheet
CT440/CT440-PDL optical component tester - English (United States)
Spec sheet
CT440/CT440-PDL optical component tester - Français (Canada)
Spec sheet
CT440/CT440-PDL optical component tester - 中文(中国)
Application notes
Assessing passive components using a CT440 or an OSA20 - English
(May 08, 2018)
Application notes
CT440 line detection feature for accurate wavelength measurement - English
(July 27, 2018)
Application notes
Swept IL measurement: Key notions and future-proof solutions - English
(April 23, 2019)
Reference posters
Testing photonic integrated circuits and passive components - English (United States)
(February 03, 2023)
Reference posters
Testing photonic integrated circuits and passive components - 中文(中国)
(February 03, 2023)
White papers
Optical component testing in a rapidly evolving 5G world - English (United States)
(May 15, 2019)
Brochures and catalogs
Optical testing solutions for manufacturing and R&D - English
(May 04, 2023)