Resources
All resources
Blog
Mastering the Mueller method with swept IL-PDL measurements - English
(May 12, 2021)
Webinar
Testing cutting-edge optical components with cutting-edge technologies - English
(May 16, 2023)
Application notes
Thin film filters: optical testing with the CTP10 test platform - English
(March 27, 2023)
Brochures and catalogs
Passive component characterization - English
(December 01, 2022)
Brochures and catalogs
Passive component characterization - 中文
(December 01, 2022)
Application notes
Sub-picometer measurements using the CTP10 logging function - English
(March 23, 2020)
Declaration of conformity
CTP10 | CE - English (United States)
(January 10, 2019)
User manual
CTP10 - English
(October 12, 2023)
Application notes
OFDR measurement using the CTP10 test platform - English
(March 27, 2023)
Application notes
IL and RL characterization of PM optical components - English
(March 27, 2023)
Application notes
CTP10 test platform: sharing configuration for manufacturing environments - English
(July 24, 2020)