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Resources
All resources
Blog
Challenges of integrated photonics: testing high-precision microring resonators - English
(November 25, 2024)
Blog
Mastering the Mueller method with swept IL-PDL measurements - English
(May 12, 2021)
Webinar
Testing cutting-edge optical components with cutting-edge technologies - English
(May 16, 2023)
Application notes
Thin film filters: optical testing with the CTP10 test platform - English
(March 27, 2023)
Brochures and catalogs
Passive component characterization - English
(December 23, 2024)
Brochures and catalogs
Passive component characterization - 中文
(December 23, 2024)
Declaration of conformity
CTP10 | CE - English
(January 10, 2019)
User manual
CTP10 - English
(December 03, 2024)
Application notes
OFDR measurement using the CTP10 test platform - English
(March 27, 2023)
Application notes
IL and RL characterization of PM optical components - English
(March 27, 2023)
Application notes
CTP10 test platform: sharing configuration for manufacturing environments - English
(July 24, 2020)
