Resources
All resources
Application notes
Automated crosstalk characterization using the CTP10 - English
(March 29, 2023)
Application notes
Programming the CTP10 component test platform - English
(April 11, 2022)
Application notes
Swept IL measurement: Key notions and future-proof solutions - English
(April 23, 2019)
Application notes
Insertion loss referencing procedure on the CTP10 test platform - English
(March 27, 2023)
Application notes
Return loss referencing using the CTP-10 test platform - English
(March 27, 2023)
Reference posters
Testing photonic integrated circuits and passive components - English (United States)
(February 03, 2023)
Reference posters
Testing photonic integrated circuits and passive components - 中文(中国)
(February 03, 2023)
Spec sheet
CTP10 - English
(September 29, 2023)
Spec sheet
CTP10 - 中文
(September 29, 2023)
White papers
Optical component testing in a rapidly evolving 5G world - English (United States)
(May 15, 2019)
Brochures and catalogs
Optical testing solutions for manufacturing and R&D - English
(May 04, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - English (United States)
(June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 中文(中国)
(June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 日本語 (日本)
(June 20, 2023)