IQS-12002 - optical calibration system
The IQS-12002 allows you to perform regular verification and calibration of your test equipment on-site without costly downtime and shipment delays.
The IQS-12002 allows you to perform regular verification and calibration of your test equipment on-site without costly downtime and shipment delays.
The IQS-12001B maximizes production throughput for insertion loss (IL) and mandrel-free reflection testing for all types of fiber-optic interconnect cables and for component assemblies such as planar arrays and PLC splitters used in FTTx systems.
The IQS-12004B test system enables fast, accurate, high-resolution IL, PDL and ORL characterization of dense WDM passive components and combines a sweeping tunable laser source, a multichannel optional power meter, a wavelength reference module and an optional polarization state adjuster.
The IQS-12004B-MPT provides highly accurate IL, PDL spectral characterization for multipath components. With a flexible software environment and the integration of a low-PDL optical switch, this option is ideal for Telcordia qualification of DWDM filters and branching devices.
Designed for R&D, qualification and production applications, the IQS-12008 performs complete characterization for virtually any passive component, ideal for component manufacturers (qualification and production), system manufacturers and integrators, labs, research institutes and universities.
The IQS-2300 is a high-power, non-polarized broadband optical source ideal for stable, repetitive insertion loss and optical return loss measurements.
La fuente de láser WDM IQS-2400 está diseñada para simulaciones de redes de longitud de onda múltiple, entradas múltiples y simultáneas para caracterización de EDFA, así como también para medición de pérdidas de inserción de componentes pasivos de WDM.
La fuente de láser configurable IQS-2600B es ideal para realizar pruebas en componentes de WDM densos en los rangos de bandas C y L.
Based on a modified Littman-Metcalf configuration, this external-cavity laser (ECL) uses a semi-conductor laser diode as gain media and a mobile tuning element outside the gain media, enabling highly accurate wavelength selection.
The fully programmable IQS-3100 variable attenuator offers reliable and repeatable performance and is ideal for automated BER testing.
The IQS-3200 module is particularly well suited for quality control and inspection during product manufacturing, as well as for system/component troubleshooting and bidirectional reflectance measurements.