CT440/CT440-PDL - 无源元器件测试仪

紧凑的测试仪，用于快速、准确地鉴定无源光元器件

规格书用户手册

Key Features

快速测量变化函数

波长范围为1240-1680 nm（SMF型号）

PM和PDL选件

波长分辨率为1-250 pm

波长精度为±5 pm

单次扫描的动态范围为65 dB

最多可结合4个可调谐激光器（SMF型号）

配备四个内部检测器，可通过同步进行扩展

Applications

Photonic integrated circuit (PIC) testing

Wavelength selective switch testing

Optical filter testing

Specifications

Technical specifications
Product type	Benchtop

规格书

Full Description

EXFO’s compact CT440 lets you quickly and accurately test passive optical components (e.g., MUX/DEMUX, filters, splitters) and modules (ROADM, WSS). What’s more, the unit covers the spectral range from 1240 to 1680 nm, allowing for measurements over the full telecom band. With the PDL option, the CT440 can simultaneously measure insertion loss and polarization dependent loss.

Full-band sweep

The CT440 (SMF model) can operate between 1240 and 1680 nm. When several TLSs are used, the CT440 can automatically switch between the lasers to allow for seamless full‑band measurements. The single connection to the DUT means no external switch is required.

Fast insertion loss measurement

The CT440 features a unique combination of high-speed electronics and optical interferometry. The four integrated detectors let you simultaneously measure four channels with a 65 dB dynamic range in a single laser sweep. Moreover, ±5 pm wavelength accuracy is achieved at any sweep velocity, so there is no compromise between measurement speed and accuracy.

Accurate insertion loss measurement

The CT440 is a cost-effective solution that doesn’t compromise on performance. With its monitoring photodetector, adjustable sampling resolution, superior wavelength accuracy and built-in wavemeter, it delivers everything you need for accurate measurements in a single box when interfaced with a tunable laser source and PC.